Y. You
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1988
1
EE
Y. You,
John P. Hayes
: Implementation of VLSI self-testing by regularization.
IEEE Trans. on CAD of Integrated Circuits and Systems 7
(12): 1261-1271 (1988)
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John P. Hayes
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Sun May 17 03:24:02 2009 by
Michael Ley
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ley@uni-trier.de
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