Shinji Yokogawa
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2006
1
EE
Hideaki Tsuchiya
, Shinji Yokogawa: Electromigration lifetimes and void growth at low cumulative failure probability.
Microelectronics Reliability 46
(9-11): 1415-1420 (2006)
Coauthor
Index
1
Hideaki Tsuchiya
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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