| |
| 2006 | ||
|---|---|---|
| 2 | EE | Hideaki Tsuchiya, Shinji Yokogawa: Electromigration lifetimes and void growth at low cumulative failure probability. Microelectronics Reliability 46(9-11): 1415-1420 (2006) |
| 2004 | ||
| 1 | EE | Hideaki Tsuchiya, Noburu Uemura, Shuichi Itoh: Optical flow detection using segmentation and MDL criterion. Systems and Computers in Japan 35(9): 51-59 (2004) |
| 1 | Shuichi Itoh | [1] |
| 2 | Noburu Uemura | [1] |
| 3 | Shinji Yokogawa | [2] |