Gilbert Yoh
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2000
1
EE
Gilbert Yoh,
Farid N. Najm
: A Statistical Model for Electromigration Failures.
ISQED 2000
: 45-50
Coauthor
Index
1
Farid N. Najm
[
1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
