Takashi Yoda

2005
2	EE	Takashi Kawanoue, Seiichi Omoto, Masahiko Hasunuma, Takashi Yoda: Investigation of Cu ion drift through CVD TiSiN into SiO2 under bias temperature stress conditions. IEICE Electronic Express 2(7): 254-259 (2005)
2004
1	EE	Takashi Yoda, Hirokazu Ezawa, Kaori Tsutsumi, Makoto Honda: The sprint process of Al interconnects with low-temperature PVD via filling. IEICE Electronic Express 1(9): 263-268 (2004)

Coauthor Index

1	Hirokazu Ezawa	[1]
2	Masahiko Hasunuma	[2]
3	Makoto Honda	[1]
4	Takashi Kawanoue	[2]
5	Seiichi Omoto	[2]
6	Kaori Tsutsumi	[1]

Colors in the list of coauthors