Y. T. Yeow

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2001

1 EE C. T. Hsu, M. M. Lau, Y. T. Yeow: Analysis of the gate capacitance measurement technique and its application for the evaluation of hot-carrier degradation in submicrometer MOSFETs. Microelectronics Reliability 41(2): 201-209 (2001)

2001
1	EE	C. T. Hsu, M. M. Lau, Y. T. Yeow: Analysis of the gate capacitance measurement technique and its application for the evaluation of hot-carrier degradation in submicrometer MOSFETs. Microelectronics Reliability 41(2): 201-209 (2001)

Coauthor Index

1 C. T. Hsu [1]

2 M. M. Lau [1]