C. T. Hsu

2008
2	EE	Yu-Lun Huang, J. Doug Tygar, H. Y. Lin, L. Y. Yeh, H. Y. Tsai, K. Sklower, Shiuh-Pyng Shieh, C. C. Wu, P. H. Lu, S. Y. Chien, Z. S. Lin, L. W. Hsu, C. W. Hsu, C. T. Hsu, Y. C. Wu, M. S. Leong: SWOON: A Testbed for Secure Wireless Overlay Networks. CSET 2008
2001
1	EE	C. T. Hsu, M. M. Lau, Y. T. Yeow: Analysis of the gate capacitance measurement technique and its application for the evaluation of hot-carrier degradation in submicrometer MOSFETs. Microelectronics Reliability 41(2): 201-209 (2001)

Coauthor Index

1	S. Y. Chien	[2]
2	C. W. Hsu	[2]
3	L. W. Hsu	[2]
4	Yu-Lun Huang	[2]
5	M. M. Lau	[1]
6	M. S. Leong	[2]
7	H. Y. Lin	[2]
8	Z. S. Lin	[2]
9	P. H. Lu	[2]
10	Shiuh-Pyng Shieh (Shiuh-Pyng Winston Shieh)	[2]
11	K. Sklower	[2]
12	H. Y. Tsai	[2]
13	J. Doug Tygar (J. D. Tygar)	[2]
14	C. C. Wu	[2]
15	Y. C. Wu	[2]
16	L. Y. Yeh	[2]
17	Y. T. Yeow	[1]

Colors in the list of coauthors