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| 2008 | ||
|---|---|---|
| 1 | EE | Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, Tien-Yeh Li: Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits. ICCAD 2008: 278-285 |
| 1 | Chih-Hong Hwang | [1] |
| 2 | Tien-Yeh Li | [1] |
| 3 | Yiming Li | [1] |