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Ta-Ching Yeh

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2008
1EEYiming Li, Chih-Hong Hwang, Ta-Ching Yeh, Tien-Yeh Li: Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits. ICCAD 2008: 278-285

Coauthor Index

1Chih-Hong Hwang [1]
2Tien-Yeh Li [1]
3Yiming Li [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)