| |
| 2008 | ||
|---|---|---|
| 2 | EE | Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, Tien-Yeh Li: Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits. ICCAD 2008: 278-285 |
| 2007 | ||
| 1 | EE | Yiming Li, Chih-Hong Hwang, Shao-Ming Yu: Numerical Simulation of Static Noise Margin for a Six-Transistor Static Random Access Memory Cell with 32nm Fin-Typed Field Effect Transistors. International Conference on Computational Science (4) 2007: 227-234 |
| 1 | Tien-Yeh Li | [2] |
| 2 | Yiming Li | [1] [2] |
| 3 | Ta-Ching Yeh | [2] |
| 4 | Shao-Ming Yu | [1] |