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Pui L. Yee

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1992
1 Robert M. Booth Jr., Kurt A. Tallman, Timothy J. Wiltshire, Pui L. Yee: A statistical approach to quality control of non-normal lithographical overlay distributions. IBM Journal of Research and Development 36(5): 835-844 (1992)

Coauthor Index

1Robert M. Booth Jr. [1]
2Kurt A. Tallman [1]
3Timothy J. Wiltshire [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)