2007 | ||
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2 | EE | Xiangning Yang, Kewal K. Saluja: Combating NBTI Degradation via Gate Sizing. ISQED 2007: 47-52 |
1 | EE | Xiangning Yang, Eric F. Weglarz, Kewal K. Saluja: On NBTI Degradation Process in Digital Logic Circuits. VLSI Design 2007: 723-730 |
1 | Kewal K. Saluja | [1] [2] |
2 | Eric F. Weglarz | [1] |