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Xiangning Yang

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2007
2EEXiangning Yang, Kewal K. Saluja: Combating NBTI Degradation via Gate Sizing. ISQED 2007: 47-52
1EEXiangning Yang, Eric F. Weglarz, Kewal K. Saluja: On NBTI Degradation Process in Digital Logic Circuits. VLSI Design 2007: 723-730

Coauthor Index

1Kewal K. Saluja [1] [2]
2Eric F. Weglarz [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)