| |
| 2003 | ||
|---|---|---|
| 2 | EE | Ken-ichi Okada, Kento Yamaoka, Hidetoshi Onodera: A Statistical Gate-Delay Model Considering Intra-Gate Variability. ICCAD 2003: 908-913 |
| 1 | EE | Ken-ichi Okada, Kento Yamaoka, Hidetoshi Onodera: Statistical modeling of gate-delay variation with consideration of intra-gate variability. ISCAS (5) 2003: 513-516 |
| 1 | Ken-ichi Okada | [1] [2] |
| 2 | Hidetoshi Onodera | [1] [2] |