Yoshiteru Yamada

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2004

1 EE Yoshiteru Yamada, Hirotaka Komoda: An example of fault site localization on a 0.18 mum CMOS device with combination of front and backside techniques. Microelectronics Reliability 44(5): 771-778 (2004)

2004
1	EE	Yoshiteru Yamada, Hirotaka Komoda: An example of fault site localization on a 0.18 mum CMOS device with combination of front and backside techniques. Microelectronics Reliability 44(5): 771-778 (2004)

Coauthor Index

1 Hirotaka Komoda [1]