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K. Xue

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2005
1EEJian Chen, Jianbin Xu, K. Xue, J. An, Ning Ke, W. Cao, H. B. Xia, J. Shi, D. C. Tian: Nanoscale structural characteristics and electron field emission properties of transition metal-fullerene compound TiC60 films. Microelectronics Reliability 45(1): 137-142 (2005)

Coauthor Index

1J. An [1]
2W. Cao [1]
3Jian Chen [1]
4Ning Ke [1]
5J. Shi [1]
6D. C. Tian [1]
7H. B. Xia [1]
8Jianbin Xu [1]

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