| |
| 2005 | ||
|---|---|---|
| 1 | EE | Jian Chen, Jianbin Xu, K. Xue, J. An, Ning Ke, W. Cao, H. B. Xia, J. Shi, D. C. Tian: Nanoscale structural characteristics and electron field emission properties of transition metal-fullerene compound TiC60 films. Microelectronics Reliability 45(1): 137-142 (2005) |
| 1 | J. An | [1] |
| 2 | W. Cao | [1] |
| 3 | Jian Chen | [1] |
| 4 | Ning Ke | [1] |
| 5 | J. Shi | [1] |
| 6 | D. C. Tian | [1] |
| 7 | Jianbin Xu | [1] |
| 8 | K. Xue | [1] |