E. Y. Wu
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2004
1
EE
R.-P. Vollertsen
, E. Y. Wu: Voltage acceleration and t63.2 of 1.6-10 nm gate oxides.
Microelectronics Reliability 44
(6): 909-916 (2004)
Coauthor
Index
1
R.-P. Vollertsen
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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