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2003 | ||
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2 | EE | Emil V. Jelenkovic, K. Y. Tong, W. Y. Cheung, S. P. Wong: Degradation of RuO2 thin films in hydrogen atmosphere at temperatures between 150 and 250 degreeC. Microelectronics Reliability 43(1): 49-55 (2003) |
1996 | ||
1 | EE | C. K. Lee, S. P. Wong: A mathematical morphological approach for segmenting heavily noise-corrupted images. Pattern Recognition 29(8): 1347-1358 (1996) |
1 | W. Y. Cheung | [2] |
2 | Emil V. Jelenkovic | [2] |
3 | C. K. Lee | [1] |
4 | K. Y. Tong | [2] |