S. P. Wong

2003
2	EE	Emil V. Jelenkovic, K. Y. Tong, W. Y. Cheung, S. P. Wong: Degradation of RuO2 thin films in hydrogen atmosphere at temperatures between 150 and 250 degreeC. Microelectronics Reliability 43(1): 49-55 (2003)
1996
1	EE	C. K. Lee, S. P. Wong: A mathematical morphological approach for segmenting heavily noise-corrupted images. Pattern Recognition 29(8): 1347-1358 (1996)

Coauthor Index

1	W. Y. Cheung	[2]
2	Emil V. Jelenkovic	[2]
3	C. K. Lee	[1]
4	K. Y. Tong	[2]

Colors in the list of coauthors