| |
| 2003 | ||
|---|---|---|
| 2 | EE | Ingrid De Wolf: MEMS reliability. Microelectronics Reliability 43(7): 1047-1048 (2003) |
| 2001 | ||
| 1 | EE | Ingrid De Wolf, Mahmoud Rasras: Spectroscopic photon emission microscopy: a unique tool for failure analysis of microelectronics devices. Microelectronics Reliability 41(8): 1161-1169 (2001) |
| 1 | Mahmoud Rasras | [1] |