2001 |
3 | EE | Christian Rembe,
Harald Aschemann,
Stefan aus der Wiesche,
Eberhard P. Hofer,
Hélèn Debéda,
Jürgen Mohr,
Ulrike Wallrabe:
Testing and improvement of micro-optical-switch dynamics.
Microelectronics Reliability 41(3): 471-480 (2001) |
1998 |
2 | | Eberhard P. Hofer,
Stefan aus der Wiesche,
Christian Rembe,
Joachim Patzer,
Peter Gluche,
Rüdiger Leuner,
Erhard Kohn:
The Diamond Ink Jet.
Electronic Imaging 1998: 306-315 |
1 | | Christian Rembe,
Stefan aus der Wiesche,
Michael Beuten,
Eberhard P. Hofer:
Investigations of nonreproducible phenomena in thermal ink jets with real high speed cine photomicrography.
Electronic Imaging 1998: 316-325 |