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Kazufumi Watanabe

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2007
2EEKazufumi Watanabe, Akinobu Teramoto, Rihito Kuroda, Shigetoshi Sugawa, Tadahiro Ohmi: Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction. Microelectronics Reliability 47(2-3): 409-418 (2007)
1984
1 Hiroshi G. Okuno, Ikuo Takeuchi, Nobuyasu Ohsato, Yasushi Hibino, Kazufumi Watanabe: TAO: Afst Interpreter-Centered Lisp System on Lisp Machine ELIS. LISP and Functional Programming 1984: 140-149

Coauthor Index

1Yasushi Hibino [1]
2Rihito Kuroda [2]
3Tadahiro Ohmi [2]
4Nobuyasu Ohsato [1]
5Hiroshi G. Okuno [1]
6Shigetoshi Sugawa [2]
7Ikuo Takeuchi [1]
8Akinobu Teramoto [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)