| |
| 2006 | ||
|---|---|---|
| 2 | EE | Hou-Kuei Huang, Chou-Sern Wang, Mau-Phon Houng, Yeong-Her Wang: Hot-electron effects on AlGaAs/InGaAs/GaAs PHEMTs under accelerated DC stresses. Microelectronics Reliability 46(12): 2025-2031 (2006) |
| 1 | EE | Hou-Kuei Huang, Cieh-Pin Chang, Mau-Phon Houng, Yeong-Her Wang: Current-dependent hot-electron stresses on InGaP-gated and AlGaAs-gated low noise PHEMTs. Microelectronics Reliability 46(12): 2038-2043 (2006) |
| 1 | Cieh-Pin Chang | [1] |
| 2 | Mau-Phon Houng | [1] [2] |
| 3 | Hou-Kuei Huang | [1] [2] |
| 4 | Chou-Sern Wang | [2] |