| |
| 2006 | ||
|---|---|---|
| 1 | EE | Hou-Kuei Huang, Cieh-Pin Chang, Mau-Phon Houng, Yeong-Her Wang: Current-dependent hot-electron stresses on InGaP-gated and AlGaAs-gated low noise PHEMTs. Microelectronics Reliability 46(12): 2038-2043 (2006) |
| 1 | Mau-Phon Houng | [1] |
| 2 | Hou-Kuei Huang | [1] |
| 3 | Yeong-Her Wang | [1] |