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C. Q. Wang

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2006
1EEH. T. Chen, C. Q. Wang, M. Y. Li: Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling. Microelectronics Reliability 46(8): 1348-1356 (2006)

Coauthor Index

1H. T. Chen [1]
2M. Y. Li [1]

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