H. T. Chen

2006
2	EE	K. S. Chen, C. H. Wang, H. T. Chen: A MAIC approach to TFT-LCD panel quality improvement. Microelectronics Reliability 46(7): 1189-1198 (2006)
1	EE	H. T. Chen, C. Q. Wang, M. Y. Li: Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling. Microelectronics Reliability 46(8): 1348-1356 (2006)

Coauthor Index

1	K. S. Chen	[2]
2	M. Y. Li	[1]
3	C. H. Wang	[2]
4	C. Q. Wang	[1]

Colors in the list of coauthors