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1999 | ||
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4 | EE | Gerard A. Allan, Anthony J. Walton: Efficient extra material critical area algorithms. IEEE Trans. on CAD of Integrated Circuits and Systems 18(10): 1480-1486 (1999) |
1997 | ||
3 | EE | Gerard A. Allan, Anthony J. Walton: Efficient critical area estimation for arbitrary defect shapes. DFT 1997: 20-28 |
1994 | ||
2 | Gerard A. Allan, Anthony J. Walton: Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. DFT 1994: 88-96 | |
1992 | ||
1 | EE | Gerard A. Allan, Anthony J. Walton, Robert J. Holwill: A yield improvement technique for IC layout using local design rules. IEEE Trans. on CAD of Integrated Circuits and Systems 11(11): 1355-1362 (1992) |
1 | Gerard A. Allan | [1] [2] [3] [4] |
2 | Robert J. Holwill | [1] |