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Anthony J. Walton

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1999
4EEGerard A. Allan, Anthony J. Walton: Efficient extra material critical area algorithms. IEEE Trans. on CAD of Integrated Circuits and Systems 18(10): 1480-1486 (1999)
1997
3EEGerard A. Allan, Anthony J. Walton: Efficient critical area estimation for arbitrary defect shapes. DFT 1997: 20-28
1994
2 Gerard A. Allan, Anthony J. Walton: Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. DFT 1994: 88-96
1992
1EEGerard A. Allan, Anthony J. Walton, Robert J. Holwill: A yield improvement technique for IC layout using local design rules. IEEE Trans. on CAD of Integrated Circuits and Systems 11(11): 1355-1362 (1992)

Coauthor Index

1Gerard A. Allan [1] [2] [3] [4]
2Robert J. Holwill [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)