| |
| 2004 | ||
|---|---|---|
| 1 | EE | A. Bouhdada, R. Marrakh, F. Vigué, J.-P. Faurie: Modeling of the spectral response of PIN photodetectors Impact of exposed zone thickness, surface recombination velocity and trap concentration. Microelectronics Reliability 44(2): 223-228 (2004) |
| 1 | A. Bouhdada | [1] |
| 2 | J.-P. Faurie | [1] |
| 3 | R. Marrakh | [1] |