J.-P. Faurie

2004
1	EE	A. Bouhdada, R. Marrakh, F. Vigué, J.-P. Faurie: Modeling of the spectral response of PIN photodetectors Impact of exposed zone thickness, surface recombination velocity and trap concentration. Microelectronics Reliability 44(2): 223-228 (2004)

Coauthor Index

1	A. Bouhdada	[1]
2	R. Marrakh	[1]
3	F. Vigué	[1]