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| 2003 | ||
|---|---|---|
| 2 | EE | S. V. Danylyuk, S. A. Vitusevich, B. Podor, A. E. Belyaev, A. Yu. Avksentyev, Vinayak Tilak, J. Smart, Alexei Vertiatchikh, Lester F. Eastman: The investigation of properties of electron transport in AlGaN/GaN heterostructures. Microelectronics Journal 34(5-8): 575-577 (2003) |
| 1 | EE | Hyungtak Kim, Alexei Vertiatchikh, Richard M. Thompson, Vinayak Tilak, Thomas R. Prunty, James R. Shealy, Lester F. Eastman: Hot electron induced degradation of undoped AlGaN/GaN HFETs. Microelectronics Reliability 43(6): 823-827 (2003) |
| 1 | A. Yu. Avksentyev | [2] |
| 2 | A. E. Belyaev | [2] |
| 3 | S. V. Danylyuk | [2] |
| 4 | Lester F. Eastman | [1] [2] |
| 5 | Hyungtak Kim | [1] |
| 6 | B. Podor | [2] |
| 7 | Thomas R. Prunty | [1] |
| 8 | James R. Shealy | [1] |
| 9 | J. Smart | [2] |
| 10 | Richard M. Thompson | [1] |
| 11 | Vinayak Tilak | [1] [2] |
| 12 | S. A. Vitusevich | [2] |