| |
| 2003 | ||
|---|---|---|
| 1 | EE | Hyungtak Kim, Alexei Vertiatchikh, Richard M. Thompson, Vinayak Tilak, Thomas R. Prunty, James R. Shealy, Lester F. Eastman: Hot electron induced degradation of undoped AlGaN/GaN HFETs. Microelectronics Reliability 43(6): 823-827 (2003) |
| 1 | Lester F. Eastman | [1] |
| 2 | Thomas R. Prunty | [1] |
| 3 | James R. Shealy | [1] |
| 4 | Richard M. Thompson | [1] |
| 5 | Vinayak Tilak | [1] |
| 6 | Alexei Vertiatchikh | [1] |