Dilip P. Vasudevan
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2008
1
EE
Dilip P. Vasudevan,
Aristides Efthymiou
: A Partial Scan Based Test Generation for Asynchronous Circuits.
DDECS 2008
: 186-189
Coauthor
Index
1
Aristides Efthymiou
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
