V. Em. Vamvakas

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2005

1 EE V. Em. Vamvakas, D. Davazoglou: Influence of the annealing temperature on the IR properties of SiO₂ films grown from SiH₄+O₂. Microelectronics Reliability 45(5-6): 986-989 (2005)

2005
1	EE	V. Em. Vamvakas, D. Davazoglou: Influence of the annealing temperature on the IR properties of SiO₂ films grown from SiH₄+O₂. Microelectronics Reliability 45(5-6): 986-989 (2005)

Coauthor Index

1 D. Davazoglou [1]