Tarang Vaish
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2005
1
EE
Shantanu Gupta
, Tarang Vaish,
Santanu Chattopadhyay
: Flip-flop chaining architecture for power-efficient scan during test application.
Asian Test Symposium 2005
: 410-413
Coauthor
Index
1
Santanu Chattopadhyay
[
1
]
2
Shantanu Gupta
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)