| |
| 1995 | ||
|---|---|---|
| 2 | EE | Mahsa Vahidi, Alex Orailoglu: Metric-based transformations for self testable VLSI designs with high test concurrency. EURO-DAC 1995: 136-141 |
| 1 | EE | Mahsa Vahidi, Alex Orailoglu: Testability metrics for synthesis of self-testable designs and effective test plans. VTS 1995: 170-175 |
| 1 | Alex Orailoglu | [1] [2] |