| |
| 2005 | ||
|---|---|---|
| 2 | EE | Tuomas F. Waris, Markus P. K. Turunen, Tomi Laurila, Jorma K. Kivilahti: Evaluation of electrolessly deposited NiP integral resistors on flexible polyimide substrate. Microelectronics Reliability 45(3-4): 665-673 (2005) |
| 2004 | ||
| 1 | EE | Markus P. K. Turunen, Pekka Marjamäki, Matti Paajanen, Jouko Lahtinen, Jorma K. Kivilahti: Pull-off test in the assessment of adhesion at printed wiring board metallisation/epoxy interface. Microelectronics Reliability 44(6): 993-1007 (2004) |
| 1 | Jorma K. Kivilahti | [1] [2] |
| 2 | Jouko Lahtinen | [1] |
| 3 | Tomi Laurila | [2] |
| 4 | Pekka Marjamäki | [1] |
| 5 | Matti Paajanen | [1] |
| 6 | Tuomas F. Waris | [2] |