| |
| 1986 | ||
|---|---|---|
| 2 | EE | David R. Tryon: Self-testing with correlated faults. DAC 1986: 374-377 |
| 1984 | ||
| 1 | David R. Tryon, Fred M. Armstrong, Mark R. Reiter: Statistical Failure Analysis of System Timing. IBM Journal of Research and Development 28(4): 340-355 (1984) | |
| 1 | Fred M. Armstrong | [1] |
| 2 | Mark R. Reiter | [1] |