| |
| 1993 | ||
|---|---|---|
| 3 | Robert P. Treuer, Vinod K. Agarwal: Fault Location Algorithms for Repairable Embedded. ITC 1993: 825-834 | |
| 2 | EE | Robert P. Treuer, Vinod K. Agarwal: Built-In Self-Diagnosis for Repairable Embedded RAMs. IEEE Design & Test of Computers 10(2): 24-33 (1993) |
| 1987 | ||
| 1 | Robert P. Treuer, Vinod K. Agarwal, Hideo Fujiwara: A New Built-In Self-Test Design for PLA's with High Fault Coverage and Low Overhead. IEEE Trans. Computers 36(3): 369-373 (1987) | |
| 1 | Vinod K. Agarwal | [1] [2] [3] |
| 2 | Hideo Fujiwara | [1] |