J. Touzel
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2005
1
EE
G. Neumann
, J. Touzel,
R. Duschl
: Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products.
Microelectronics Reliability 45
(9-11): 1520-1525 (2005)
Coauthor
Index
1
R. Duschl
[
1
]
2
G. Neumann
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)