| |
| 2008 | ||
|---|---|---|
| 4 | EE | Lee-Ing Tong, Li-Chang Chao: Novel yield model for integrated circuits with clustered defects. Expert Syst. Appl. 34(4): 2334-2341 (2008) |
| 3 | EE | Lee-Ing Tong, Chung-Ho Wang, Chih-Wei Tsai: Robust design for multiple dynamic quality characteristics using data envelopment analysis. Quality and Reliability Eng. Int. 24(5): 557-571 (2008) |
| 2007 | ||
| 2 | EE | Kun-Lin Hsieh, Lee-Ing Tong, Min-Chia Wang: The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory. Expert Syst. Appl. 32(3): 765-776 (2007) |
| 2004 | ||
| 1 | EE | Lee-Ing Tong, Chung-Ho Wang, Chih-Chien Chen, Chun-Tzu Chen: Dynamic multiple responses by ideal solution analysis. European Journal of Operational Research 156(2): 433-444 (2004) |
| 1 | Li-Chang Chao | [4] |
| 2 | Chih-Chien Chen | [1] |
| 3 | Chun-Tzu Chen | [1] |
| 4 | Kun-Lin Hsieh | [2] |
| 5 | Chih-Wei Tsai | [3] |
| 6 | Chung-Ho Wang | [1] [3] |
| 7 | Min-Chia Wang | [2] |