Li-Chang Chao
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2008
1
EE
Lee-Ing Tong
, Li-Chang Chao: Novel yield model for integrated circuits with clustered defects.
Expert Syst. Appl. 34
(4): 2334-2341 (2008)
Coauthor
Index
1
Lee-Ing Tong
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
