Min-Chia Wang

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2007

1 EE Kun-Lin Hsieh, Lee-Ing Tong, Min-Chia Wang: The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory. Expert Syst. Appl. 32(3): 765-776 (2007)

2007
1	EE	Kun-Lin Hsieh, Lee-Ing Tong, Min-Chia Wang: The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory. Expert Syst. Appl. 32(3): 765-776 (2007)

Coauthor Index

1 Kun-Lin Hsieh [1]

2 Lee-Ing Tong [1]