J. Tomas
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2006
1
EE
B. Foucher
, J. Tomas,
F. Mounsi
,
M. Jeremias
: Life margin assessment with Physics of Failure Tools application to BGA packages.
Microelectronics Reliability 46
(5-6): 1013-1018 (2006)
Coauthor
Index
1
B. Foucher
[
1
]
2
M. Jeremias
[
1
]
3
F. Mounsi
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
