2006 | ||
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1 | EE | Yasuyuki Morita, Kazuo Arakawa, Mitsugu Todo, Masayuki Kaneto: Experimental study on the thermo-mechanical effects of underfill and low-CTE substrate in a flip-chip device. Microelectronics Reliability 46(5-6): 923-929 (2006) |
1 | Kazuo Arakawa | [1] |
2 | Masayuki Kaneto | [1] |
3 | Yasuyuki Morita | [1] |