| |
| 2004 | ||
|---|---|---|
| 1 | EE | David M. Wu, Mike Lin, Madhukar Reddy, Talal Jaber, Anil Sabbavarapu, Larry Thatcher: An Optimized DFT and Test Pattern Generation Strategy for an Intel High Performance Microprocessor. ITC 2004: 38-47 |
| 1 | Talal Jaber | [1] |
| 2 | Mike Lin | [1] |
| 3 | Madhukar Reddy | [1] |
| 4 | Anil Sabbavarapu | [1] |
| 5 | David M. Wu | [1] |