Seiji Terada
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1999
1
Michinobu Nakao
,
Seiji Kobayashi
,
Kazumi Hatayama
,
Kazuhiko Iijima
, Seiji Terada: Low overhead test point insertion for scan-based BIST.
ITC 1999
: 348-357
Coauthor
Index
1
Kazumi Hatayama
[
1
]
2
Kazuhiko Iijima
[
1
]
3
Seiji Kobayashi
[
1
]
4
Michinobu Nakao
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
