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| 2007 | ||
|---|---|---|
| 2 | EE | David E. Duarte, Greg Taylor, Keng L. Wong, Usman Mughal, George Geannopoulos: Advanced thermal sensing circuit and test techniques used in a high performance 65nm processor. ISLPED 2007: 304-309 |
| 2004 | ||
| 1 | EE | Ali Muhtaroglu, Benoit Provost, Tawfik Rahal-Arabi, Greg Taylor: I/O Self-Leakage Test. ITC 2004: 903-906 |
| 1 | David E. Duarte | [2] |
| 2 | George Geannopoulos | [2] |
| 3 | Usman Mughal | [2] |
| 4 | Ali Muhtaroglu | [1] |
| 5 | Benoit Provost | [1] |
| 6 | Tawfik Rahal-Arabi | [1] |
| 7 | Keng L. Wong | [2] |