2007 | ||
---|---|---|
2 | EE | David E. Duarte, Greg Taylor, Keng L. Wong, Usman Mughal, George Geannopoulos: Advanced thermal sensing circuit and test techniques used in a high performance 65nm processor. ISLPED 2007: 304-309 |
2004 | ||
1 | EE | Ali Muhtaroglu, Benoit Provost, Tawfik Rahal-Arabi, Greg Taylor: I/O Self-Leakage Test. ITC 2004: 903-906 |
1 | David E. Duarte | [2] |
2 | George Geannopoulos | [2] |
3 | Usman Mughal | [2] |
4 | Ali Muhtaroglu | [1] |
5 | Benoit Provost | [1] |
6 | Tawfik Rahal-Arabi | [1] |
7 | Keng L. Wong | [2] |