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2007 | ||
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1 | EE | David E. Duarte, Greg Taylor, Keng L. Wong, Usman Mughal, George Geannopoulos: Advanced thermal sensing circuit and test techniques used in a high performance 65nm processor. ISLPED 2007: 304-309 |
1 | George Geannopoulos | [1] |
2 | Usman Mughal | [1] |
3 | Greg Taylor | [1] |
4 | Keng L. Wong | [1] |