Erin Taylor
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2005
1
EE
Jie Han
, Erin Taylor,
Jianbo Gao
,
José A. B. Fortes
: Faults, Error Bounds and Reliability of Nanoelectronic Circuits.
ASAP 2005
: 247-253
Coauthor
Index
1
José A. B. Fortes
[
1
]
2
Jianbo Gao
[
1
]
3
Jie Han
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
