| |
| 1997 | ||
|---|---|---|
| 2 | EE | Xinghai Tang, Vivek De, James D. Meindl: Intrinsic MOSFET parameter fluctuations due to random dopant placement. IEEE Trans. VLSI Syst. 5(4): 369-376 (1997) |
| 1996 | ||
| 1 | EE | Xinghai Tang, Vivek De, James D. Meindl: Effects of random MOSFET parameter fluctuations on total power consumption. ISLPED 1996: 233-236 |
| 1 | Vivek De | [1] [2] |
| 2 | James D. Meindl | [1] [2] |