Rishan Tan

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2001

1 EE Dilip K. Bhavsar, Rishan Tan: Observability Register Architecture For Efficient Production Test And Debug Of Vlsi Circuits. VLSI Design 2001: 385-390

2001
1	EE	Dilip K. Bhavsar, Rishan Tan: Observability Register Architecture For Efficient Production Test And Debug Of Vlsi Circuits. VLSI Design 2001: 385-390

Coauthor Index

1 Dilip K. Bhavsar [1]