H. Takizawa

2001
1		S. Yokogawa, N. Okada, Y. Kakuhara, H. Takizawa: Electromigration Performance of Multi-level Damascene Copper Interconnects. Microelectronics Reliability 41(9-10): 1409-1416 (2001)

Coauthor Index

1	Y. Kakuhara	[1]
2	N. Okada	[1]
3	S. Yokogawa	[1]